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Active and Passive Electronic Components
Volume 19 (1997), Issue 4, Pages 225-238
http://dx.doi.org/10.1155/1997/46342

Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity

Centre d'Etudes Fondamentales, Université de Perpignan, 52, Avenue de Villeneuve, Perpignan 66860, France

Received 24 January 1996; Accepted 29 March 1996

Copyright © 1997 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

B. Affour and P. Mialhe, “Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity,” Active and Passive Electronic Components, vol. 19, no. 4, pp. 225-238, 1997. doi:10.1155/1997/46342