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Active and Passive Electronic Components
Volume 27, Issue 2, Pages 61-67
http://dx.doi.org/10.1080/1042015031000073805

Junction Parameter Extraction for Electronic Device Characterization

1Laboratoire LPSE, Département de Physique, Université Libanaise-Faculté de Sciences II, Jdeidet BP 90656, Lebanon
2LP2A, Université de Perpignan, 52 Avenue de Villeneuve, Perpignan Cedex 66 860, France

Received 22 October 2002; Revised 17 November 2002

Copyright © 2004 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

S. Dib, C. Salame, N. Toufik, A. Khoury, F. Pélanchon, and P. Mialhe, “Junction Parameter Extraction for Electronic Device Characterization,” Active and Passive Electronic Components, vol. 27, no. 2, pp. 61-67, 2004. https://doi.org/10.1080/1042015031000073805.