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Active and Passive Electronic Components
Volume 2008 (2008), Article ID 247958, 6 pages
http://dx.doi.org/10.1155/2008/247958
Research Article

Material Parameter Measurements for Microwave Antireflection Coating Development

Department of Broadband Infocommunications and Electromagnetic Theory, Budapest University of Technology and Economics, Goldmann György tér 3, 1111 Budapest, Hungary

Received 3 December 2007; Accepted 17 March 2008

Academic Editor: Tibor Berceli

Copyright © 2008 Lajos Nagy. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The main steps for characterization and measurement of microwave absorbent materials in the 1–10 GHz range are introduced. The coaxial reflection-transmission type of material parameter measurement is analyzed in detail and the main measurement error is corrected. The microscopic material particle parameter measurement concept is also presented using different mixing rule laws to determine the material parameters of the single particles from the macroscopic parameters. Two-dimensional FDTD simulations have been used to model the behavior of mixed electric and magnetic type of material.