Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC

Table 4

Results of soft-die mode.

Type		Case 1		Case 2		Case 3
𝛼∶𝛽		1 : 1	10 : 1	1 : 1	10 : 1	1 : 1	10 : 1
Hard-die mode	No. of test cycle	1,823,944	882,200	1,216,486	1,181,825	86,509,578	86,509,576
	Opt. TAM	38	113	138	162	31	31
	Normalized test cost	1.00	1.00	1.00	1.00	1.00	1.00
Soft-die mode	No. of test cycle	1,823,944	882,200	766,191	611,629	23,142,087	41,852,141
	Opt. TAM	38	113	138	162	30	27
	Normalized test cost	1.00	1.00	0.69 (−31%)	0.59 (−41%)	0.54 (−46%)	0.80 (−20%)