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Active and Passive Electronic Components
Volume 2016 (2016), Article ID 3741250, 10 pages
Research Article

Analysis of Random Variation in Subthreshold FGMOSFET

Department of Computer Engineering, Siam University, 235 Petchakasem Road, Bangkok 10163, Thailand

Received 21 April 2016; Accepted 26 June 2016

Academic Editor: Jinlong Liu

Copyright © 2016 Rawid Banchuin. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Rawid Banchuin, “Analysis of Random Variation in Subthreshold FGMOSFET,” Active and Passive Electronic Components, vol. 2016, Article ID 3741250, 10 pages, 2016. doi:10.1155/2016/3741250