Active and Passive Electronic Components

/ Table of Contents: 1985

Table of Contents: 1985

On Possibilities of Synthesis of a Useful Model of Thick Film Components

Voltage Degradation Model of Thin Film Capacitors

Comment on the Dependence of R_□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors

Optical Fibre Connectors for Harsh Environments

Stability Observations and Surface Analysis of Air Fired Nickel Thick Film Conductors

Electrochemical Migration in Thick-Film IC-S

Reproducibility of Properties of SnO_x Thin Films Prepared by Reactive Sputtering

Reliability Compliance Testing of Electronic Components for Consumer Electronics

The Influence of Lubrication on Electrical and Mechanical Parameters of Potentiometer Resistive Element

On Experimental Data of the TCR of TFRs and Their Relation to Theoretical Models of Conduction Mechanism

Thin Metal Film Sensors

Improved Rational Two-Port Model of Uniform R-C-NR Structure

Editorial

Active and Passive Electronic Components

Table of Contents

Table of Contents: 1985

On Possibilities of Synthesis of a Useful Model of Thick Film Components

Voltage Degradation Model of Thin Film Capacitors

Comment on the Dependence of R□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors

Optical Fibre Connectors for Harsh Environments

Stability Observations and Surface Analysis of Air Fired Nickel Thick Film Conductors

Electrochemical Migration in Thick-Film IC-S

Reproducibility of Properties of SnOx Thin Films Prepared by Reactive Sputtering

Reliability Compliance Testing of Electronic Components for Consumer Electronics

The Influence of Lubrication on Electrical and Mechanical Parameters of Potentiometer Resistive Element

On Experimental Data of the TCR of TFRs and Their Relation to Theoretical Models of Conduction Mechanism

Thin Metal Film Sensors

Improved Rational Two-Port Model of Uniform R-C-NR Structure

Editorial

Comment on the Dependence of R_□ and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Reproducibility of Properties of SnO_x Thin Films Prepared by Reactive Sputtering