Editorial Board

• Abukhari A'Ain, University of Technology Malaysia, Malaysia
• Said Al-Sarawi, University of Adelaide, Australia
• Wei-Zen Chen, National Chiao Tung University, Taiwan
• Fang Chung Chen, National Chiao Tung University, Taiwan
• Meng-Hsueh Chiang, National Cheng Kung University, Taiwan
• Ching Liang Dai, National Chung Hsing University, Taiwan
• Ezz I. El-Masry, Dalhousie University, Canada
• Gerard Ghibaudo, Grenoble Institute of Technology, France
• Stephan Gift, The University of the West Indies, Trinidad And Tobago
• Ashok Goel, Michigan Technological University, USA
• Liang Han, Ecole Polytechnique de Montreal, Canada
• Md Amanul Haque, Pennsylvania State University, USA
• S. M. Rezaul Hasan, Massey University, New Zealand
• Xunjun He, Harbin Institute of Technology, China
• Jiun-Wei Horng, Chung Yuan Christian University, Taiwan
• Tzyy-Sheng Horng, National Sun Yat-Sen University, Taiwan
• Yuh-Shyan Hwang, National Taipei University of Technology, Taiwan
• Adrian Ioinovici, Holon Institute of Technology, Israel
• Thottam S. Kalkur, University of Colorado, USA
• Iqbal A. Khan, Umm Al Qura University, Saudi Arabia
• Olga Korostynsk, Dublin Institute of Technology, Ireland
• Alexei Koudymov, Rensselaer Polytechnic Institute, USA
• Salaru B. Krupanidhi, Indian Institute of Science, India
• Mamidala Jagadesh Kumar, Indian Institute of Technology Delhi, India
• Ka Nang Leung, Chinese University of Hong Kong, Hong Kong
• Bor-Ren Lin, National Yunlin University of Science and Technology, Taiwan
• Qiao L. Lin, Columbia University, USA
• Cheng-Hsien Liu, National Tsing-Hua University, Taiwan
• Aiqun Liu, Nanyang Technological University, Singapore
• Yalin Lu, U.S. Air Force Academy, USA
• Yicheng Lu, Rutgers University, USA
• Jack Luo, Cambridge University, United Kingdom
• Sudhanshu Maheshwari, Professor, Aligarh Muslim University, India
• Abdelkarim Mercha, Interuniversity Micro-Electronics Center at Leuven, Belgium
• Jianmin Miao, Nanyang Technological University, Singapore
• Takahiro Namazu, University of Hyogo, Japan
• Chem V. Nayar, Curtin University, Australia
• Krishnamachar Prasad, Auckland University of Technology, New Zealand
• Egidio Ragonese, Università di Catania, Italy
• Tian-Ling Ren, Tsinghua University, China
• Carole Rossi, Université de Toulouse, France
• Christoph Sandner, Infineon Technologies, Austria
• Jose' A. Siqueira Dias, Universidade Estadual de Campinas, Brazil
• Ion Stiharu, Concordia University, Canada
• Yichuang Sun, University of Hertfordshire, United Kingdom
• Daisaburo Takashima, Toshiba Corporation, Japan
• Ichihiko Toyoda, Saga University, Japan
• Gianluca Traversi, Università degli studi di Bergamo, Italy
• Jung-Hui Tsai, National Kaohsiung Normal University, Taiwan
• Mingxiang Wang, Soochow University, China
• Tai-Bor Wu, National Tsing Hua University, Taiwan
• Huikai Xie, University of Florida, USA
• Shaozhen Xiong, Nankai University, China
• Fahrettin Yakuphanoglu, Firat University, Turkey
• Wen-Ming Zhang, Shanghai Jiao Tong University, China
• Guangya Zhou, National University of Singapore, Singapore