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Computational Intelligence and Neuroscience
Volume 2014, Article ID 740838, 11 pages
http://dx.doi.org/10.1155/2014/740838
Research Article

Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China

Received 29 September 2014; Accepted 15 December 2014; Published 29 December 2014

Academic Editor: J. Alfredo Hernandez

Copyright © 2014 Jingyu Zhou et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jingyu Zhou, Shulin Tian, Chenglin Yang, and Xuelong Ren, “Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine,” Computational Intelligence and Neuroscience, vol. 2014, Article ID 740838, 11 pages, 2014. https://doi.org/10.1155/2014/740838.