Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
Figure 9
(a) Misclassification rates of SVM- and ELM-based algorithms for circuit in Figure 6(b), with different numbers of impulse-response samples. (b) Misclassification rates of SVM- and ELM-based algorithms for circuit in Figure 6(c), with different numbers of impulse-response samples.
