Measuring Latency Variations in Evoked Potential Components Using a Simple Autocorrelation Technique

Figure 3

Effect of latency jitter applied to a simulated single component with onset latency 90 ms and width 20 ms in recorded EP noise of similar amplitude. Averages of 30 recordings are shown together with the reliability measure (median ) for successive 10 ms windows with (a) no jitter, (b) random jitter of ±5 ms, and (c) random jitter of ±10 ms.

(a)

(b)

(c)