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Complexity
Volume 2017 (2017), Article ID 8263904, 10 pages
https://doi.org/10.1155/2017/8263904
Research Article

Understanding the Resistive Switching Phenomena of Stacked Al/Al2O3/Al Thin Films from the Dynamics of Conductive Filaments

National Institute of Astrophysics, Optics and Electronics, Luis Enrique Erro No. 1, 72840 Tonantzintla, PUE, Mexico

Correspondence should be addressed to Joel Molina-Reyes

Received 5 May 2017; Accepted 11 July 2017; Published 20 September 2017

Academic Editor: Sundarapandian Vaidyanathan

Copyright © 2017 Joel Molina-Reyes and Luis Hernandez-Martinez. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Joel Molina-Reyes and Luis Hernandez-Martinez, “Understanding the Resistive Switching Phenomena of Stacked Al/Al2O3/Al Thin Films from the Dynamics of Conductive Filaments,” Complexity, vol. 2017, Article ID 8263904, 10 pages, 2017. doi:10.1155/2017/8263904