Research Article
Genetic Variability and Its Implications on Early Generation Sorghum Lines Selection for Yield, Yield Contributing Traits, and Resistance to Sorghum Midge
Table 14
Genetic variation for resistance to midge, yield, and yield contributing characters across planting dates at Maradi.
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GY: grain yield; PH: plant height; PW: panicle weight; FF: days to 50% flowering; TSW: 1000 seeds weight; MD: midge damage; GM: grand mean; GV: genotypic variance; PV: phenotypic variance; GCV: genotypic coefficient of variance; PCV: phenotypic coefficient of variance; : broad sense heritability; GA: genetic advance as a percentage of mean. |