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International Journal of Antennas and Propagation
Volume 2015, Article ID 497647, 11 pages
http://dx.doi.org/10.1155/2015/497647
Research Article

Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods

1College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Gyeonggi-Do 440-746, Republic of Korea
2Department of Aerospace Engineering, Inha University, Incheon 402-751, Republic of Korea

Received 23 January 2015; Accepted 15 April 2015

Academic Editor: Jiseong Kim

Copyright © 2015 Hai Au Huynh et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Hai Au Huynh, Hak-Tae Lee, Wansoo Nah, and SoYoung Kim, “Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods,” International Journal of Antennas and Propagation, vol. 2015, Article ID 497647, 11 pages, 2015. https://doi.org/10.1155/2015/497647.