Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods

<div>Comparison of DPI and BCI input power (<svg height="11.6478pt" id="M62" style="vertical-align:-3.051061pt" version="1.1" viewbox="-0.0498162 -8.59674 14.7882 11.6478" width="14.7882pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M622 479C622 589 545 650 400 650H146L140 618C229 609 230 602 215 527L135 132C117 43 112 41 27 32L18 0H305L313 32C213 40 205 44 222 132L251 284L324 262H365C484 269 622 333 622 479ZM528 477C528 356 420 305 344 305C300 305 276 314 259 321L303 554C311 597 313 600 331 606C345 611 361 614 379 614C463 614 528 580 528 477Z" id="g50-81"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="640" vert-adv-y="640"></glyph.data></g><g transform="matrix(.0091,0,0,-0.0091,6.721,3.001)"><path d="M135 536C164 536 186 560 186 587C186 617 164 639 136 639C109 639 85 617 85 587C85 560 109 536 135 536ZM252 0V26C188 32 181 38 181 106V451C138 433 90 420 39 412V388C99 379 102 374 102 312V106C102 38 95 32 32 26V0H252Z" id="g190-106"></path><glyph.data ascent="989" descent="-360" horiz-adv-x="268" vert-adv-y="268"></glyph.data></g><g transform="matrix(.0091,0,0,-0.0091,9.16,3.001)"><path d="M524 0V26C466 32 460 36 460 104V297C460 393 411 449 331 449C302 449 276 437 248 419C223 402 201 387 181 372V451C137 432 90 420 42 411V388C96 378 102 374 102 310V104C102 38 97 33 29 26V0H246V26C187 32 181 36 181 104V339C211 365 250 390 290 390C357 390 381 345 381 276V109C381 40 374 32 315 26V0H524Z" id="g190-111"></path><glyph.data ascent="989" descent="-360" horiz-adv-x="547" vert-adv-y="547"></glyph.data></g></svg>). (a) With <svg height="9.01192pt" id="M63" style="vertical-align:-0.2063904pt" version="1.1" viewbox="-0.0498162 -8.80553 29.4462 9.01192" width="29.4462pt" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink"><g transform="matrix(.013,0,0,-0.013,0,0)"><path d="M158 548H390L417 615L410 623H122L83 318C105 326 143 337 185 337C296 337 350 275 350 188C350 116 308 42 225 42C164 42 122 74 100 93C90 101 82 99 72 92C60 82 51 68 50 59C48 46 52 38 66 24C82 9 125 -12 172 -12C225 -11 292 15 346 59C408 108 437 166 437 226C437 309 371 397 242 397C214 397 170 382 133 369L158 548Z" id="g50-54"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="487" vert-adv-y="487"></glyph.data></g><g transform="matrix(.013,0,0,-0.013,6.331,0)"><path d="M245 635C92 635 37 457 37 312C37 149 91 -12 244 -12C395 -12 449 166 449 312C449 469 395 635 245 635ZM243 598C332 598 358 454 358 312C358 173 334 26 245 26C158 26 128 174 128 313S152 598 243 598Z" id="g50-49"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="487" vert-adv-y="487"></glyph.data></g><g transform="matrix(.013,0,0,-0.013,14.868,0)"><path d="M727 145L694 147C669 79 660 74 614 74H536C582 128 696 227 696 364C696 547 564 666 388 666C215 666 78 544 78 361C78 224 189 126 240 74H155C117 74 102 83 79 147L48 145L64 0H313L320 21C290 72 182 208 182 360C182 527 261 628 387 628S593 523 593 362C593 199 488 69 456 21L461 0H709L727 145Z" id="g50-153"></path><glyph.data ascent="3443" descent="-2856" horiz-adv-x="768" vert-adv-y="768"></glyph.data></g></svg>load. (b) With chip VDD/VSS port impedance load.</div>

International Journal of Antennas and Propagation

fig20

Figure 20

Figure 20: Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods 