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International Journal of Antennas and Propagation
Volume 2017, Article ID 7852135, 7 pages
https://doi.org/10.1155/2017/7852135
Research Article

A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components

School of Electronic Engineering, University of Electronic Science and Technology of China, No. 2006, Xiyuan Road, West Hi-Tech Zone, Chengdu 611731, China

Correspondence should be addressed to Xin Cao; moc.qq@957998897

Received 18 February 2017; Accepted 27 April 2017; Published 14 May 2017

Academic Editor: N. Nasimuddin

Copyright © 2017 Xin Cao and Zongxi Tang. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Xin Cao and Zongxi Tang, “A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components,” International Journal of Antennas and Propagation, vol. 2017, Article ID 7852135, 7 pages, 2017. https://doi.org/10.1155/2017/7852135.