X-ray diffraction patterns of cerium oxide films deposited from a solution of 0.1 M Ce(NO3)3 and 0.1 M acetic acid pH = 7.5, -axis X-ray intensity in cps. (a) Galvanostatic mode: deposition current density of −0.06 mA/cm2 at (A) 25, (B) 50, (C) 70, and (D) 80°C. (b) Potentiostatic mode: deposition potential of 1.10 V at (A) 25, (B) 50, and (C) 70°C.
