Table of Contents
International Journal of Microwave Science and Technology
Volume 2012 (2012), Article ID 650754, 4 pages
http://dx.doi.org/10.1155/2012/650754
Research Article

Spatial Qualification Tests for Highly Selective Compact Micromachined Band Pass Planar Filters

1CSAM IEMN UMR 8520, Université de Lille 1/CNRS, Avenue Poincaré, Cité Scientifique, 59650 Villeneuve d’Ascq, France
2XLIM UMR 6172, Université de Limoges/CNRS, 123 Avenue Albert Thomas, 87060 Limoges Cedex, France
3Thales Alénia Space, 26 Avenue Jean François Champollion 31100 Toulouse, France
4Reinhardt Microtech AG, Aeulistraβe 10, 7323 Wangs, Switzerland
5CNES, 18 Rue Edouard Belin, 31000 Toulouse, France

Received 1 June 2012; Accepted 20 August 2012

Academic Editor: Fermín Mira

Copyright © 2012 Raghida Hajj et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Raghida Hajj, Matthieu Chatras, Pierre Blondy, Olivier Vendier, Wolfgang Tschanum, and Frederic Courtade, “Spatial Qualification Tests for Highly Selective Compact Micromachined Band Pass Planar Filters,” International Journal of Microwave Science and Technology, vol. 2012, Article ID 650754, 4 pages, 2012. doi:10.1155/2012/650754