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International Journal of Optics
Volume 2011, Article ID 683415, 11 pages
http://dx.doi.org/10.1155/2011/683415
Research Article

Coherent Population Trapping Resonances in Cs Atomic Vapor Layers of Micrometric Thickness

Institute of Electronics, Bulgarian Academy of Sciences, 72 Tsarigradsko Chaussee Boulevard, 1784 Sofia, Bulgaria

Received 29 April 2011; Revised 12 June 2011; Accepted 19 June 2011

Academic Editor: Adrian Podoleanu

Copyright © 2011 A. Krasteva et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

We report on a novel behavior of the electromagnetically induced absorption (EIA) resonance observed on the D2 line of Cs for atoms confined in cells with micrometric thickness. With the enhancement of light intensity, the EIA resonance amplitude suffers from fast reduction, and even at very low intensity (W < 1 mW/cm2), resonance sign reversal takes place and electromagnetically induced transparency (EIT) resonance is observed. Similar EIA resonance transformation to EIT one is not observed in conventional cm-size cells. A theoretical model is proposed to analyze the physical processes behind the EIA resonance sign reversal with light intensity. The model involves elastic interactions between Cs atoms as well as elastic interaction of atom micrometric-cell windows, both resulting in depolarization of excited state which can lead to the new observations. The effect of excited state depolarization is confirmed also by the fluorescence (absorption) spectra measurement in micrometric cells with different thicknesses.