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International Journal of Optics
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International Journal of Optics
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2012
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Article
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Fig 7
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Research Article
Tuning Metamaterials for Applications at DUV Wavelengths
Figure 7
Electric field intensity profiles below 7 nm-34 nm-7 nm Al-Al
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O
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-Al stack (left) and 20 nm Al film (right) deposited on a sapphire prism.
(a)
(b)