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International Journal of Optics
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International Journal of Optics
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2013
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Article
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Fig 10
/
Research Article
Preparation and Characterization of (Au/n-Sn
/Si
/Si/Al) MIS Device for Optoelectronic Application
Figure 10
The Quantum efficiency as a function of the incident wavelength. (a) (n-SnO
2
/n-Si) device, (b) (n- SnO
2
/p-Si) MIS device.
(a)
(b)