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International Journal of Photoenergy
Volume 2007, Article ID 18298, 4 pages
http://dx.doi.org/10.1155/2007/18298
Research Article

Delineation of Crystalline Extended Defects on Multicrystalline Silicon Wafers

Silicon Technology Unit of Algiers (UDTS), 2 Boulevard Frantz Fanon, BP 399 Alger-Gare, Algiers, Algeria

Received 23 March 2006; Accepted 15 August 2006

Academic Editor: Nicolas Alonso-Vante

Copyright © 2007 Mohamed Fathi. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Mohamed Fathi, “Delineation of Crystalline Extended Defects on Multicrystalline Silicon Wafers,” International Journal of Photoenergy, vol. 2007, Article ID 18298, 4 pages, 2007. https://doi.org/10.1155/2007/18298.