Photoelectrochemical Characterization of Sprayed - Thin Films: Influence of Si Doping and Interfacial Layer
Figure 4
(a) IPCE curve
for 0.1% Si-doped Fe2O3 measured at 0.4 V versus Ag/AgCl.
(b) Momentary and integrated solar photocurrent of the sample obtained by
multiplying IPCE with the photon flux spectrum of AM1.5 sunlight. When
correcting for the actual experimental intensity of 80 mW/cm2,
an integrated photocurrent of mA/cm2 is obtained.
