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International Journal of Photoenergy
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International Journal of Photoenergy
/
2009
/
Article
/
Tab 1
/
Research Article
Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film
Table 1
Chemical composition of
layers formed in PA matrices, depending on the duration of film pretreatment time.
Parameter
Duration time of treating the PA films in
solution, h
4
5
Sulfur concentration
,
3.10
3.26
Copper concentration
,
2.04
2.24
Cu/S molar ratio