Research Article

Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

Table 1

Chemical composition of layers formed in PA matrices, depending on the duration of film pretreatment time.

ParameterDuration time of treating the PA films in solution, h
45

Sulfur concentration , 3.103.26
Copper concentration , 2.042.24
Cu/S molar ratio