Preparation and Characterization of <svg     style="vertical-align:-4.47125pt;width:59.612499px;" id="M1" height="21.65" version="1.1" viewBox="0 0 59.612499 21.65" width="59.612499"  xmlns:xlink="http://www.w3.org/1999/xlink" xmlns="http://www.w3.org/2000/svg">
	
		
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</svg> Thin Films by Coevaporation

<table>XRD patterns of Sb<sub>2</sub>Te<sub>3</sub> thin films annealed at 473 K (a) and 613 K (b).</table>

International Journal of Photoenergy

fig2

Figure 2

Figure 2: Preparation and Characterization of <svg     style="vertical-align:-4.47125pt;width:59.612499px;" id="M1" height="21.65" version="1.1" viewBox="0 0 59.612499 21.65" width="59.612499"  xmlns:xlink="http://www.w3.org/1999/xlink" xmlns="http://www.w3.org/2000/svg">
	
		
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</svg> Thin Films by Coevaporation 

International Journal of Photoenergy

Preparation and Characterization of Thin Films by Coevaporation

Figure 2