Research Article
Optimal I-V Curve Scan Time of Solar Cells and Modules in Light of Irradiance Level
Table 3
Capacitive curve tracer I-V results: measurement versus simulation.
| | | | Scan time/maximum power/measurement error/simulation error | | | | t, ms/, W/, %/, % | | C m [mF] | Meas. | pc-Si | mc-Si | BC mc-Si |
| | 39.1 ± 2% | Ref. | 22.0 | 3.30 | — | — | 20.5 | 4.29 | — | — | 27.1 | 2.90 | — | — | | 28.5 ± 2% | A | 17.1 | 3.29 | 0.2* | 0.01 | 14.8 | 4.28 | 0.14 | 0.17 | 19.0 | 2.87 | 0.76 | 0.8 | | 17.7 ± 2% | B | 10.4 | 3.29 | 0.2* | 0.05 | 9.1 | 4.26 | 0.21 | 0.26 | 10.8 | 2.82 | 1.34 | 1.41 | | 11.6 ± 2% | C | 7.2 | 3.28 | 0.2* | 0.9 | 6.1 | 4.23 | 0.61 | 0.57 | 7.4 | 2.77 | 2.1 | 2.4 | | 5.0 ± 2% | D | 3.1 | 3.26 | 0.38 | 0.31 | 2.8 | 4.16 | 1.2 | 1.17 | 3.2 | 2.62 | 4.15 | 4.91 |
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*
s/n ratio too low for accurate error determination.
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