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International Journal of Photoenergy
Volume 2012 (2012), Article ID 324853, 5 pages
http://dx.doi.org/10.1155/2012/324853
Research Article

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

1Department of Electrotechnology, Faculty of Electrical Engineering and Communication, Brno University of Technology, Udolni 53, 602 00 Brno, Czech Republic
2Department of Physics, Faculty of Civil Engineering, Brno University of Technology, Žižkova 17, 602 00 Brno, Czech Republic
3Department of Solar-Cells, Solartec s.r.o., Televizní 2618, 765 61 Rožnov pod Radhoštěm, Czech Republic

Received 2 September 2011; Accepted 5 December 2011

Academic Editor: Stephen Bremner

Copyright © 2012 Jiří Vanek et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.