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International Journal of Photoenergy
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International Journal of Photoenergy
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2012
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Article
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Fig 8
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Research Article
Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
Figure 8
Microplasma method-scanning time 20 s, reverse voltage 4.0 V, current 0.15 A, sample no. 3149-25.