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International Journal of Photoenergy
Volume 2013, Article ID 108696, 9 pages
http://dx.doi.org/10.1155/2013/108696
Research Article

Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate

1Graduate Institute of Precision Engineering, National Chung Hsing University, Taichung 402, Taiwan
2Department of Materials Science and Engineering, DaYeh University, Changhua 515, Taiwan

Received 14 June 2013; Revised 30 October 2013; Accepted 4 November 2013

Academic Editor: Antonino Bartolotta

Copyright © 2013 Ray-Hua Horng et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Ray-Hua Horng, Ming-Chun Tseng, and Shui-Yang Lien, “Reliability Analysis of III-V Solar Cells Grown on Recycled GaAs Substrates and an Electroplated Nickel Substrate,” International Journal of Photoenergy, vol. 2013, Article ID 108696, 9 pages, 2013. https://doi.org/10.1155/2013/108696.