Table of Contents Author Guidelines Submit a Manuscript
International Journal of Photoenergy
Volume 2013, Article ID 313904, 7 pages
http://dx.doi.org/10.1155/2013/313904
Research Article

Effects of Phosphorus Diffusion on Gettering of Metal Impurities in UMG Silicon Wafers

1Department of Electronics Engineering, Sejong University, Seoul 143-747, Republic of Korea
2KICET Icheon Branch, Korea Institute of Ceramic Engineering and Technology, Icheon 467-843, Republic of Korea

Received 29 January 2013; Accepted 17 October 2013

Academic Editor: Junsin Yi

Copyright © 2013 Sung Yean Yoon et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sung Yean Yoon, Jeong Kim, and Kyoon Choi, “Effects of Phosphorus Diffusion on Gettering of Metal Impurities in UMG Silicon Wafers,” International Journal of Photoenergy, vol. 2013, Article ID 313904, 7 pages, 2013. https://doi.org/10.1155/2013/313904.