International Journal of Photoenergy / 2013 / Article / Fig 10

Research Article

Surface Passivation and Antireflection Behavior of ALD on n-Type Silicon for Solar Cells

Figure 10

Reflectance of bare Si wafer and Si with TiO2 thin films grown at different temperatures as function of wavelength from 300 nm to 1200 nm.
431614.fig.0010

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