| Parameter | n-SnO2 | n-Zn2SnO4 | n-CdS | p-CdTe | ZnTe/As2Te3/Sb2Te3/Cu2Te | Comments and references |
| Thickness (μm) | 0.1 | 0.2 | 0.06 | 0.1–5.0 | 0.2 | Theory and estimations | Dielectric constant, ɛ/ɛ 0 | 9.0 | 9.0 | 10.0 | 9.4 | 14/20/55/10 | As discussed elsewhere [3, 12, 16, 20, 21] | Electron mobility, μe (cm2/Vs) | 100 | 32 | 100 | 320 | 70/500/1094/500 | As discussed elsewhere [12, 16, 18, 21, 22] | Hole mobility, μp (cm2/Vs) | 25 | 03 | 25 | 40 | 50/210/320/100 | As discussed elsewhere [13, 16, 18, 21, 22] | Electron and hole concentration, n, p (cm−3) | 1017 | 1019 | 1017 | | 1021 (Cu2Te)/7.5 × 1019 (Others) | As discussed elsewhere [13, 16, 19, 21, 23] | Bandgap, Eg (eV) | 3.6 | 3.35 | 2.42 | 1.45 | 2.25/0.6/0.3/1.18 | As discussed elsewhere [10, 13, 16, 22, 23] | Density of states at conduction band, NC (cm−3) | | | | | | As discussed elsewhere [16, 19, 21, 23, 24] | Density of states at valence band, NV (cm−3) | | | | | | As discussed elsewhere [16, 19, 21, 23, 24] | Electron affinity, χ (eV) | 4.50 | 4.50 | 4.50 | 4.28 | 3.65/4/4.15/4.20 | As discussed elsewhere [16, 18, 19, 21–24] |
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