Effect of Growth Parameters and Annealing Atmosphere on the Properties of Cu₂ZnSnS₄ Thin Films Deposited by Cosputtering

Figure 6

The high-resolution XPS spectra measured for CZTS film (a) Cu 2p, (b) Zn 2p, (c) Sn 3d, and (d) S 2p core levels, respectively.

(a)

(b)

(c)

(d)