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International Journal of Photoenergy
Volume 2013, Article ID 908786, 6 pages
Review Article

Reduction of Oxygen Impurity in Multicrystalline Silicon Production

Research Institute for Applied Mechanics, Kyushu University, Kasuga, Fukuoka 816-8580, Japan

Received 7 December 2012; Accepted 17 January 2013

Academic Editor: Bhushan Sopori

Copyright © 2013 Bing Gao et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Effective control of oxygen impurity in multicrystalline silicon is required for the production of a high-quality crystal. The basic principle and some techniques for reducing oxygen impurity in multicrystalline silicon during the unidirectional solidification process are described in this paper. The oxygen impurity in multicrystalline silicon mainly originates from the silica crucible. To effectively reduce the oxygen impurity, it is essential to reduce the oxygen generation and enhance oxygen evaporation. For reduction of oxygen generation, it is necessary to prevent or weaken any chemical reaction with the crucible, and for the enhancement of oxygen evaporation, it is necessary to control convection direction of the melt and strengthen gas flow above the melt. Global numerical simulation, which includes heat transfer in global furnace, argon gas convection inside furnace, and impurity transport in both melt and gas regions, has been implemented to validate the above methods.