Effects of Sulfurization Temperature on Properties of CZTS Films by Vacuum Evaporation and Sulfurization Method
Figure 2
The SEM images of the CZTS thin films samples obtained at different sulfurization temperatures: (a) S11 (360°C), (b) S12 (400°C), (c) S13 (450°C), (d) S14 (500°C), (e) S15 (560°C), and (f) AFM image of sample S15.
