Photoirradiation Caused Controllable Wettability Switching of Sputtered Highly Aligned c-Axis-Oriented Zinc Oxide Columnar Films
Figure 3
(a) The thickness values as a function of the ZnO thin films with different RF powers ranged from 50 to 150 W. (b) and (c) are the cross-sectional micrographs for the ZnO thin films deposited at the RF powers of 50 and 150 W, respectively.
