Research Article
Plasmon-Enhanced Photoluminescence of an Amorphous Silicon Quantum Dot Light-Emitting Device by Localized Surface Plasmon Polaritons in Ag/SiOx:a-Si QDs/Ag Sandwich Nanostructures
Figure 3
(a) XPS depth profiles for Si, O, and Ag elements in SiOx:a-Si QDs film and at SiOx:a-Si QDs film/Ag film interface. (b) Raman spectrum of SiOx:a-Si QDs film. The spectrum is separated into two components corresponding to the a-Si QDs and the Si substrate (by Gaussian fit). (c) PL spectrum of sample A.
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