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International Journal of Photoenergy
Volume 2015, Article ID 159458, 12 pages
Research Article

Optical Characterization of Different Thin Film Module Technologies

Photovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, Austria

Received 26 November 2014; Revised 23 March 2015; Accepted 23 March 2015

Academic Editor: Aldo Di Di Carlo

Copyright © 2015 R. Ebner et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


For a complete quality control of different thin film module technologies (a-Si, CdTe, and CIS) a combination of fast and nondestructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.