Table of Contents Author Guidelines Submit a Manuscript
International Journal of Photoenergy
Volume 2015, Article ID 159458, 12 pages
http://dx.doi.org/10.1155/2015/159458
Research Article

Optical Characterization of Different Thin Film Module Technologies

Photovoltaic Systems, Energy Department, Austrian Institute of Technology (AIT), Giefinggasse 2, 1210 Vienna, Austria

Received 26 November 2014; Revised 23 March 2015; Accepted 23 March 2015

Academic Editor: Aldo Di Di Carlo

Copyright © 2015 R. Ebner et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Linked References

  1. S. Zamini, “Non-destructive-techniques for quality control of photovoltaic modules: electroluminescence imaging and infrared thermography,” Photovoltaics International Journal, PV-Tech PRO, no. 15, pp. 127–203, 2012. View at Google Scholar
  2. R. Ebner, “Electroluminescence (EL) and infrared (IR) methods for characterizing different module technologies,” in Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg, Germany, September 2011.
  3. R. Ebner, “EL an infrared IR methods for characterizing different thin-film module technologies,” in Proceedings of the 3rd International Conference on Thin Film PV, Munich, Germany, 2011.
  4. C. Buerhop, “Quality control of PV-modules in the field using infrared-thermography,” in Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '11), Hamburg, Germany, 2011.
  5. U. Hoyer, C. Buerhop-Lutz, and U. Jahn, “Electroluminescence and infrared imaging for quality improvements of PV modules,” in Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '08), Valencia, Spain, September 2008. View at Publisher · View at Google Scholar
  6. U. Hoyer, C. Buerhop-Lutz, and U. Jahn, “Electroluminescence and infrared imaging for quality improvements of PV modules,” in Proceedings of the 23rd European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '08), pp. 2913–2916, Valencia, Spain, September 2008. View at Publisher · View at Google Scholar
  7. U. Hoyer, A. Burkert, R. Auer et al., “Analysis of PV modules by electroluminescence and IR thermography,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference (EU-PVSEC '09), pp. 3262–3266, Hamburg, Germany, September 2009. View at Publisher · View at Google Scholar
  8. O. Breitenstein, Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components, Springer, 2003.
  9. O. Breitenstein, “Lock-in thermography- basics and use for functional diagnostic of electronic module technologies,” in Proceedings of the the PV World Conference & Expo, Tampa, Fla, USA, 2011.
  10. M. Ankner, “Analyse von fehlerbildern an dünnschichtmodulen über das EL-verfahren,” in Proceedings of the 25th PV Symposium, Bad Staffelstein, Germany, March 2010.
  11. S. Roy, “Estimation of shunt resistance by electroluminescence imaging,” in Proceedings of the 29th European Photovoltaic Solar Energy Conference and Exhibition, Amsterdam, The Netherlands, September 2014.
  12. G. Wang, H. Gong, and J. Zhu, “Failure analysis of dark cells detected by electroluminescence (EL),” in Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '14), pp. 3173–3179, Amsterdam, The Netherlands, 2014. View at Publisher · View at Google Scholar
  13. M. Köntges, M. Siebert, D. Hinken, U. Eitner, K. Bothe, and T. Potthof, “Quantitative analysis of PV-modules by electroluminescence images for quality control,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference (EU-PVSEC '09), Hamburg, Germany, September 2009.
  14. T. Weber, “Electroluminescence investigation on thin film modules,” in Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '11), Hamburg, Germany, 2011.
  15. A. Mansouri, “Defect detection in photovoltaic modules using electroluminescence imaging,” in Proceedings of the Photovoltaic International, 2010.
  16. J. L. Crozier, “Identifying voltage dependant features in photovoltaic modules using electroluminescence imaging,” in Proceedings of the 29th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '14), Amsterdam, The Netherlands, 2014.
  17. T. Trupke, “Fast photoluminescence imaging of silicon wafers,” in Proceedings of the IEEE 4th World Conference on Photovoltaic Energy Conversion, vol. 1, pp. 928–931, Waikoloa, Hawaii, May 2006. View at Publisher · View at Google Scholar
  18. A. Lawerenz, “Photoluminescence lifetime using LED arrays exitation source,” in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition (PVSEC '10), Valencia, Spain, 2010.
  19. M. Bailly, “Photoluminescence lifetime characterization with low pressure sodium lamps,” in Proceedings of the 28th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '13), Paris, France, 2013.
  20. R. Ebner, “Defect analysis of different photovoltaic modules using electroluminescene (EL) and infrared (IR)-thermography,” in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '10), Valencia, Spain, 2010.
  21. A. Helbig, T. Kirchartz, R. Schäffler, J. H. Werner, and U. Rau, “Electroluminescence analysis of Cu(In,Ga)Se2 thin-film modules,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference (EU-PVSEC '09), pp. 2446–2449, Hamburg, Germany, September 2009. View at Publisher · View at Google Scholar
  22. A. Helbig, T. Kirchartz, R. Schäffler, J. H. Werner, and U. Rau, “Electroluminescence analysis of Cu(In,Ga)Se2 thin film modules,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference (EU-PVSEC '09), pp. 2446–2449, Hamburg, Germany, 2009. View at Publisher · View at Google Scholar
  23. R. Ebner, “Defect analysis in different photovoltaic modules using electroluminescene (EL) and infrared (IR)-thermography,” in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition (EU-PVSEC '10), Valencia, Spain, 2010.
  24. U. Hoyer, A. Burkert, R. Auer et al., “Analysis of PV modules by electroluminescence and IR thermography,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference (EU-PVSEC '09), pp. 3262–3266, Hamburg, Germany, September 2009. View at Publisher · View at Google Scholar
  25. S. Johnston, T. Unold, I. Repins et al., “Imaging characterization techniques applied to Cu(In, Ga)Se2 solar cells,” Journal of Vacuum Science & Technology A, vol. 28, p. 665, 2010. View at Publisher · View at Google Scholar
  26. R. Ebner, “Electroluminescence (EL) and infrared (IR) imaging of different module technologies,” in Proceedings of the PV World Conference & Expo, Tampa, Fla, USA, 2011.
  27. R. Ebner, B. Kubicek, and G. Ujvari, “Non-destructive techniques for quality control of PV modules: Infrared thermography, electro- and photoluminescence imaging,” in Proceedings of the 39th Annual Conference of the IEEE Industrial Electronics Society (IECON '13), pp. 8104–8109, Vienna, Austria, November 2013. View at Publisher · View at Google Scholar
  28. T. Trupke, R. A. Bardos, M. D. Abbott, F. W. Chen, J. E. Cotter, and A. Lorenz, “Fast photoluminescence imaging of silicon wafers,” in Proceedings of the IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC '06), vol. 1, pp. 928–931, May 2006. View at Publisher · View at Google Scholar · View at Scopus
  29. R. Ebner, S. Zamini, and G. Újvári, “Defect analysis in different photovoltaic modules using electroluminescence (EL) and infrared (IR)-thermography,” in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition (PVSEC '10), pp. 333–336, Valencia, Spain, September 2010. View at Publisher · View at Google Scholar