International Journal of Photoenergy / 2016 / Article / Fig 8

Research Article

Enhanced Light Scattering by Preferred Orientation Control of Ga Doped ZnO Films Prepared through MOCVD

Figure 8

Surface morphology of GZO film with thickness ~800 nm on different ZnO buffer layer thicknesses: (a) 212 nm, (b) 422 nm, (c) 652 nm, and (d) 766 nm. The deposition temperature of GZO film was 400°C.

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