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International Journal of Photoenergy
Volume 2018, Article ID 4381579, 6 pages
Research Article

The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior

1Beijing University of Technology, Beijing 100124, China
2CECEP Solar Energy Technology (Zhenjiang) Co., Ltd., Zhenjiang 212132, China
3Beijing Jiaotong University, Beijing 100044, China

Correspondence should be addressed to Hao Zhuang; nc.cescec@oahgnauhz

Received 26 October 2017; Accepted 9 January 2018; Published 18 February 2018

Academic Editor: Reyna Natividad-Rangel

Copyright © 2018 Xianfang Gou et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to undergo the simulated PID test. The I-V performance and EL images of the modules were characterized before and after the PID test. The obtained results demonstrate that with the increase in the microcracked area or length, the modules would show a more serious PID behavior. The mechanism of this microcrack length-related degradation under high negative bias was proposed.