Reduced-Precision Redundancy on FPGAs

Table 3

Number of SEUs causing each class of effect for an FIR filter protected with TMR and several levels of RPR using experimentally determined thresholds (𝑇^∗_ℎ), compared to mathematically determined thresholds (𝑇_ℎ).

Design	Slices used	Class 1 bits	Class 2 bits	Class 3 bits	Class 4 bits	Total catastrophic (% reduction)	Improv. in failure rate
Unmitigated	1,030	59,156	6,472	1,501	943	2,444 (—%)	—
RPR, 𝐵𝑟=7, 𝑇ℎ	1,755	106,751	6,239	11	2	13 (99.47%)	188×
RPR, 𝐵𝑟=7, 𝑇^∗ℎ	1,755	106,863	6,191	11	2	13 (99.47%)	188×
RPR, 𝐵𝑟=5, 𝑇ℎ	1,470	84,284	7,819	226	2	228 (90.67%)	10.7×
RPR, 𝐵𝑟=5, 𝑇^∗ℎ	1,470	84,583	7,709	42	2	44 (98.20%)	55.5×
RPR, 𝐵𝑟=3, 𝑇ℎ	1,313	73,992	6,875	1,598	666	2,264 (7.36%)	1.08×
RPR, 𝐵𝑟=3, 𝑇^∗ℎ	1,313	74,129	8,267	634	36	670 (72.59%)	3.65×