Review Article

Raman Spectroscopy for Quantitative Analysis of Point Defects and Defect Clusters in Irradiated Graphite

Figure 13

Arrhenius plot of determined by the fitting analysis. The values of are expressed in R.I. Units. This plot corresponds to the critical dose of amorphization as expressed by (7). Two linear relations are clearly seen, giving activation energy of 0.083 eV below 573 K and 0.58 eV above 573 K. The TEM results on the change of diffraction pattern from halo and spot to halo can be seen to give two similar linear relations.
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