Annular Beam Shaping in Multiphoton Microscopy to Reduce Out-of-Focus Background

Figure 7

(a) The phase pattern applied at the SLM to generate an annular beam. The desired annulus is displayed in reflection mode with no phase shift ( = 0) displayed in black, while the undesired part of the beam is deflected by applying a phase shift gradient (). (b) A representative image of the acquired beam profile measured after the SLM. Dimensions of beam profiler image: 4.7 mm × 6.3 mm.

(a)

(b)