Table of Contents
ISRN Nanotechnology
Volume 2011, Article ID 305687, 4 pages
http://dx.doi.org/10.5402/2011/305687
Research Article

Characterization of Nanocrystalline Yttria-Stabilized Zirconia: An In Situ HTXRD Study

1Naval Materials Research Laboratory, Ambernath, India
2Ceramic Division, Naval Materials Research Laboratory, Ambernath, India
3Department of Marine Materials, Naval Materials Research Laboratory, Ambernath, India

Received 17 February 2011; Accepted 20 March 2011

Academic Editors: P. O. Käll, Ivan Škorvánek, and V. Valtchev

Copyright © 2011 Mridula Biswas et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Nanocrystalline yttria-stabilized zirconia powders, synthesized by the citrate nitrate gel combustion route, with yttria concentration varying from 8 to 12 mol% were studied by in situ high temperature X-ray diffraction in the temperature range of 25–1000°C. The sample obtained has a high specific surface area of 35 m2/g while calculated surface area was around 123 m2/g. The in situ high temperature X-ray diffraction study revealed that crystallite size remains in the range of 7–9 nm up to 800°C and then rapidly grows up to 21–23 nm upto 1000°C; only holding the material at 1000°C for 30 minutes can promote grain growth in the range of 42–49 nm. Coefficient of thermal expansion ranges from 9.65 to 9.03 ppm/°C for 8–12 mol% nanocrystalline yttria-stabilized zirconia.