DC Conduction and Switching Mechanisms in Electroformed Al/ZnTe:V/Cu Devices at Atmospheric Pressure

<table><i>I-V</i> curves for a 150 nm thickness of Al/ZnTe:V/Cu structure at different compositions:  (■) 2.5,  (♦) 5.0, (<i>▼</i>) 7.5, and (▲) 10 wt% V.</table>

International Scholarly Research Notices

fig2

Figure 2

Figure 2: DC Conduction and Switching Mechanisms in Electroformed Al/ZnTe:V/Cu Devices at Atmospheric Pressure 