International Scholarly Research Notices / 2011 / Article / Fig 2

Research Article

DC Conduction and Switching Mechanisms in Electroformed Al/ZnTe:V/Cu Devices at Atmospheric Pressure

Figure 2

I-V curves for a 150 nm thickness of Al/ZnTe:V/Cu structure at different compositions: (■) 2.5, (♦) 5.0, () 7.5, and (▲) 10 wt% V.

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