Spray Pyrolysis Deposition of Nanostructured Tin Oxide Thin Films

Table 2

X-ray diffraction analysis of the SnO₂ thin films.

(h k l) planes	Angle, 2𝜃 (degree)	d spacing (Å)	FWHM	Crystallite size (nm)
(1 1 0)	26.60	3.3484	0.163	34
(1 0 1)	33.90	3.6422	0.171	33
(2 0 0)	38.00	2.3660	0.190	32
(1 1 1)	39.00	2.3076	0.182	30
(2 1 0)	42.60	2.1206	0.130	28
(2 1 1)	51.80	1.7635	0.159	32
(2 2 0)	54.80	1.6738	0.185	30
(0 0 2)	57.80	1.5939	0.126	29
(3 1 0)	61.90	1.4978	0.150	30
(1 1 2)	64.80	1.4376	0.223	26
(3 0 1)	66.00	1.4143	0.174	30
(2 0 2)	71.30	1.3216	0.168	28
(3 2 1)	78.70	1.2149	0.132	27