International Scholarly Research Notices / 2012 / Article / Fig 4

Research Article

Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes

Figure 4

Comparison of charge extraction BELIV current transients simulated for single-type traps (dash) and for simultaneously acting several-type generation centers (dots) with that simulated without contribution of thermal emission from traps (solid curve).
543790.fig.004

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