Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes

<table>Variations of barrier and diffusion capacitance charging currents dependent on irradiation fluence as a function of voltage increase within LIV pulse in Si pin detector, at the same LIV parameters.</table>

International Scholarly Research Notices

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Figure 8

Figure 8: Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes 