International Scholarly Research Notices / 2012 / Article / Fig 8

Research Article

Barrier Evaluation by Linearly Increasing Voltage Technique Applied to Si Solar Cells and Irradiated Pin Diodes

Figure 8

Variations of barrier and diffusion capacitance charging currents dependent on irradiation fluence as a function of voltage increase within LIV pulse in Si pin detector, at the same LIV parameters.

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