Research Article

Visible and Deep-Ultraviolet Raman Spectroscopy as a Tool for Investigation of Structural Changes and Redistribution of Carbon in Ni-Based Ohmic Contacts on Silicon Carbide

Table 2

Positions of maxima and FWHM’s (in cm−1) of profiles obtained from fitted Lorentzian components. In brackets there are historical signs of carbon bands. In the case of nsc1_2 it was impossible to split G band into components, so the maximum and FWHM are given for . The data of the profile used to model the hole in nsc1_3 were omitted because this profile is not discussed in the paper.

Profile numbernsc1_1nsc1_3nsc1_2
Max. (cm−1)FWHM (cm−1)Max. (cm−1)FWHM (cm−1)Max. (cm−1)FWHM (cm−1)

1356,146.81356,038.31351,368.4
1587,938.41587.754.21603.065.0
1623,919.61619.622.0