Table of Contents
ISRN Optics
Volume 2012, Article ID 859353, 23 pages
http://dx.doi.org/10.5402/2012/859353
Review Article

Advanced Nanomeasuring Techniques for Surface Characterization

Engineering and Surface Metrology Department, Length and Precision Engineering Division, National Institute for Standards (NIS), Giza 12211-136, Egypt

Received 26 August 2012; Accepted 18 October 2012

Academic Editors: L. Carretero, O. Frazão, H. Matsumoto, and A. E. Miroshnichenko

Copyright © 2012 Salah H. R. Ali. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Advanced precise and accurate nanomeasurement techniques play an important role to improve the function and quality of surface characterization. There are two basic approaches, the hard measuring techniques and the soft computing measuring techniques. The advanced soft measuring techniques include coordinate measuring machines, roundness testing facilities, surface roughness, interferometric methods, confocal optical microscopy, scanning probe microscopy, and computed tomography at the level of nanometer scale. On the other hand, a new technical committee in ISO is established to address characterization issues posed by the areal surface texture and measurement methods. This paper reviews the major advanced soft metrology techniques obtained by optical, tactile, and other means using instruments, classification schemes of them, and their applications in the engineering surfaces. Furthermore, future trends under development in this area are presented and discussed to display proposed solutions for the important issues that need to be addressed scientifically.